UM
Direct current field and temperature dependent behaviors of antiferroelectric to ferroelectric switching in highly (100)-oriented PbZrO3 thin films
Zhai J.; Chen H.
2003-04-21
Source PublicationApplied Physics Letters
ISSN00036951
Volume82Issue:16Pages:2673-2675
AbstractThe electric-field induced antiferroelectric (AFE) to ferroelectric (FE) phase switching was studied in sol-gel processed PbZrO thin films. The AFE to FE phase switching shifted to a lower temperature under a dc bias field. It was found that the adjustability of the AFE phase to FE in temperature was weakened if the thickness of the thin film decreased.
DOI10.1063/1.1569420
URLView the original
Language英語
Fulltext Access
Citation statistics
Cited Times [WOS]:34   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionUniversity of Macau
AffiliationCity University of Hong Kong
Recommended Citation
GB/T 7714
Zhai J.,Chen H.. Direct current field and temperature dependent behaviors of antiferroelectric to ferroelectric switching in highly (100)-oriented PbZrO3 thin films[J]. Applied Physics Letters,2003,82(16):2673-2675.
APA Zhai J.,&Chen H..(2003).Direct current field and temperature dependent behaviors of antiferroelectric to ferroelectric switching in highly (100)-oriented PbZrO3 thin films.Applied Physics Letters,82(16),2673-2675.
MLA Zhai J.,et al."Direct current field and temperature dependent behaviors of antiferroelectric to ferroelectric switching in highly (100)-oriented PbZrO3 thin films".Applied Physics Letters 82.16(2003):2673-2675.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zhai J.]'s Articles
[Chen H.]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zhai J.]'s Articles
[Chen H.]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zhai J.]'s Articles
[Chen H.]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.