Multistage process monitoring and diagnosis
Lianjie Shu; Fugee Tsung
Conference Name2000 IEEE International Conference on Management of Innovation and Technology
Source PublicationProceedings of the 2000 IEEE International Conference on Management of Innovation and Technology. ICMIT 2000. 'Management in the 21st Century' (Cat. No.00EX457)
Conference Date12-15 Nov. 2000
Conference PlaceSingapore

As manufacturing quality has become a decisive factor in global market competition, quality control techniques such as Statistical Process Control (SPC) are becoming popular in industries. With advances in information, sensing, and data capture technology, large volumes of data are being routinely collected and shared over multiple-stage processes, which have growing impacts on the existing quality control methods that usually focus only on individual stage in the process. This research tackles some unique issues due to multistage interaction, and proposes an enhanced cause-selecting chart to monitor and diagnose a multistage process.

KeywordCause-selecting Chart Multistage Process Studentised Residual
Indexed ByCPCI
WOS Research AreaComputer Science ; Engineering
WOS SubjectComputer Science, Information Systems ; Engineering, Industrial ; Engineering, Manufacturing
WOS IDWOS:000173048900146
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Cited Times [WOS]:2   [WOS Record]     [Related Records in WOS]
Document TypeConference paper
AffiliationDepartment of Industrial Engineering & Engineering Management Hong Kong University of Science and Technology Hong Kong
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GB/T 7714
Lianjie Shu,Fugee Tsung. Multistage process monitoring and diagnosis[C],2000:881-886.
APA Lianjie Shu,&Fugee Tsung.(2000).Multistage process monitoring and diagnosis.Proceedings of the 2000 IEEE International Conference on Management of Innovation and Technology. ICMIT 2000. 'Management in the 21st Century' (Cat. No.00EX457),881-886.
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