UM  > Faculty of Science and Technology
Residential Collegefalse
Status已發表Published
Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method
Zhou,Yongzhi1; Wu,Hao1; Lou,Boliang2; Deng,Hui2; Song,Yonghua1,3; Hua,Wen2; Shen,Yijun2
2019-03-16
Source PublicationElectric Power Components and Systems
ISSN1532-5008
Volume47Issue:4-5Pages:345-356
Abstract

A novel method is proposed to calculate the area of vulnerability (AOV) to voltage sags, which can reflect the relationship between the position of fault occurrence and voltage sags at sensitive buses. Previous methods based on interpolation approach are mainly based on the assumption that the fault voltage magnitude curve has a unimodal shape, which does not hold in all cases. Moreover, the accuracy of polynomial interpolation is largely affected by the selection strategy of sample points, and inappropriate initial points will lead to divergence. To overcome these drawbacks, an effective approach which does not rely on sample results is proposed, where the fault voltage magnitude curve could be any arbitrary shapes. The AOV is derived by solving the parametric fault voltage equations, where Galerkin method is used to identify the polynomial approximation coefficients. With the order of polynomial approximation increased, an iteration scheme is applied, where the results in each iteration are selected as the initial points of the next iteration. Case studies show that the proposed method can provide very accurate results with high efficiency.

KeywordArea Of Vulnerability Galerkin Method Polynomial Approximation Voltage Sags
DOI10.1080/15325008.2019.1601297
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000489682400004
Scopus ID2-s2.0-85068575924
Fulltext Access
Citation statistics
Cited Times [WOS]:0   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionFaculty of Science and Technology
Corresponding AuthorWu,Hao
Affiliation1.College of Electrical Engineering,Zhejiang University,Hangzhou,China
2.State Grid Zhejiang Electric Power Research Institute,Hangzhou,China
3.Department of Electrical and Computer Engineering,University of Macau,Taipa,Macao
Recommended Citation
GB/T 7714
Zhou,Yongzhi,Wu,Hao,Lou,Boliang,et al. Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method[J]. Electric Power Components and Systems,2019,47(4-5):345-356.
APA Zhou,Yongzhi,Wu,Hao,Lou,Boliang,Deng,Hui,Song,Yonghua,Hua,Wen,&Shen,Yijun.(2019).Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method.Electric Power Components and Systems,47(4-5),345-356.
MLA Zhou,Yongzhi,et al."Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method".Electric Power Components and Systems 47.4-5(2019):345-356.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zhou,Yongzhi]'s Articles
[Wu,Hao]'s Articles
[Lou,Boliang]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zhou,Yongzhi]'s Articles
[Wu,Hao]'s Articles
[Lou,Boliang]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zhou,Yongzhi]'s Articles
[Wu,Hao]'s Articles
[Lou,Boliang]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.