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A 76.6dB-SNDR 50MHz-BW 29.2mW Multibit CT Sturdy MASH with DAC Non-Linearity Tolerance
Qi, L.; Jain, A.; Jiang, D.; Sin, S. W.; Martins, R. P.; Ortmanns, M.
2020-02-01
Source PublicationIEEE Journal of Solid-State Circuits
ISSN0018-9200
Pages344-355
Abstract

This article presents a dual-loop noise-coupling (NC)-assisted continuous-time (CT) sturdy multistage noise-shaping (SMASH) ΔΣ modulator (DSM), employing 1.5-bit/4-bit quantizers. The proposed SMASH can equivalently work as an overall fourth-order DSM with 4-bit internal quantization. The NC applied in this CT SMASH DSM whitens the 1.5-bit quantization noise (QN) and further reduces its in-band tone power, while a finite-impulse response (FIR) filter integrated into the outermost feedback path suppresses the out-of-band (OOB) noise power of the multibit digital-to-analog converter (DAC) input. Together, they avoid any linearization technique for the multibit DAC. Sampled at 1.2 GHz, the 28-nm CMOS experimental prototype measures a signal-to-noise-and-distortion ratio (SNDR) of 76.6 dB and a spurious-free dynamic range (SFDR) of 87.9 dB over a 50-MHz bandwidth (BW), consuming 29.2 mW from 1.2-V/1.5-V supplies and occupying an active area of 0.085 mm 2 . It exhibits a Schreier figure-of-merit (FoM) (SNDR) of 168.9 dB.

KeywordQuantization (Signal) Topology Multi-stage Noise Shaping Delays Wideband Calibration
URLView the original
Language英語English
The Source to ArticlePB_Publication
Fulltext Access
Document TypeJournal article
Corresponding AuthorSin, S. W.
Recommended Citation
GB/T 7714
Qi, L.,Jain, A.,Jiang, D.,et al. A 76.6dB-SNDR 50MHz-BW 29.2mW Multibit CT Sturdy MASH with DAC Non-Linearity Tolerance[J]. IEEE Journal of Solid-State Circuits,2020:344-355.
APA Qi, L.,Jain, A.,Jiang, D.,Sin, S. W.,Martins, R. P.,&Ortmanns, M..(2020).A 76.6dB-SNDR 50MHz-BW 29.2mW Multibit CT Sturdy MASH with DAC Non-Linearity Tolerance.IEEE Journal of Solid-State Circuits,344-355.
MLA Qi, L.,et al."A 76.6dB-SNDR 50MHz-BW 29.2mW Multibit CT Sturdy MASH with DAC Non-Linearity Tolerance".IEEE Journal of Solid-State Circuits (2020):344-355.
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