UM  > INSTITUTE OF MICROELECTRONICS
Affiliated with RCfalse
Status已發表Published
An Inherent Gain Error Tolerance Noise-Shaping SAR-Assisted Pipeline ADC with Code-Counter-Based Offset Calibration
Zhang, Hongshuai; Zhu, Yan; Chan, Chi Hang; Martins, Rui P.
2022-05
Source PublicationIEEE Journal of Solid-State Circuits
ISSN0018-9200
Volume57Issue:5Pages:1480-1491
Abstract

This article presents an inherent gain error-tolerant noise-shaping (NS) successive approximation register (SAR)-assisted pipelined analog-to-digital converter (ADC). The architecture is hybrid with a pure passive-feedforward (FF) NS SAR ADC in the first stage of the pipeline, realizing an N -0 (2-0) multistage NS sigma-delta (MASH). The N th order from the first stage shapes not only the quantization error and comparator noise but also the interstage gain and nonlinearity error, which greatly relaxes the gain accuracy constraint in the conventional pipelined architecture. In addition to gain, a code-counter-based (CCB) background offset calibration is introduced to mitigate the interstage offset with low cost. The prototype further adopts partial interleaving in the first stage for high speed while sharing the integration capacitors in the feed-forward (FF) structure for a compact area. The 2-0 MASH runs at 400 MS/s and achieves 25-MHz bandwidth with 8 × OSR, consuming 1.26-mW power from a 1-V supply. Within a gain error range of -16% to +12%, the SNDR of the ADC deviates less than 3 dB from the nominal 75-dB SNDR. Fabricated in a 28-nm CMOS process, it exhibits a 178-dB Schreier figure of merit (FoMS).

KeywordAmplifier Linearity Enhancement Analog-to-digital Converter (Adc) Background Offset Calibration Digital Reconstruction Filter Dwa Energy And Area Efficient Inherent Gain Error Tolerant Inter-stage Gain Error Noise Shaping (Ns) Oversampling Partial Interleaving Pipelined Successive Approximation (Sar) Quantization Leakage Error
DOI10.1109/JSSC.2021.3111912
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000732358900001
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Scopus ID2-s2.0-85115679720
Fulltext Access
Citation statistics
Cited Times [WOS]:0   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionINSTITUTE OF MICROELECTRONICS
DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Corresponding AuthorChan, Chi Hang
AffiliationDepartment of Electrical and Computer Engineering, State Key Laboratory of Analog and Mixed Signal VLSI, Faculty of Science and Technology, Institute of Microelectronics, University of Macau, 999078, Macao
First Author AffilicationFaculty of Science and Technology
Corresponding Author AffilicationFaculty of Science and Technology
Recommended Citation
GB/T 7714
Zhang, Hongshuai,Zhu, Yan,Chan, Chi Hang,et al. An Inherent Gain Error Tolerance Noise-Shaping SAR-Assisted Pipeline ADC with Code-Counter-Based Offset Calibration[J]. IEEE Journal of Solid-State Circuits,2022,57(5):1480-1491.
APA Zhang, Hongshuai,Zhu, Yan,Chan, Chi Hang,&Martins, Rui P..(2022).An Inherent Gain Error Tolerance Noise-Shaping SAR-Assisted Pipeline ADC with Code-Counter-Based Offset Calibration.IEEE Journal of Solid-State Circuits,57(5),1480-1491.
MLA Zhang, Hongshuai,et al."An Inherent Gain Error Tolerance Noise-Shaping SAR-Assisted Pipeline ADC with Code-Counter-Based Offset Calibration".IEEE Journal of Solid-State Circuits 57.5(2022):1480-1491.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zhang, Hongshuai]'s Articles
[Zhu, Yan]'s Articles
[Chan, Chi Hang]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zhang, Hongshuai]'s Articles
[Zhu, Yan]'s Articles
[Chan, Chi Hang]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zhang, Hongshuai]'s Articles
[Zhu, Yan]'s Articles
[Chan, Chi Hang]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.