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| A RELIABILITY INDEX (ai) THAT ASSUMES HONEST CODERS AND VARIABLE RANDOMNESS Conference paper Chicago, 2012-08 Authors: Zhao XS(趙心樹)
Microsoft Word | Favorite | | TC[WOS]:0 TC[Scopus]:0 | Submit date:2022/03/28 Reliability Intercoder Reliability Interrater Reliability Agreement Index Estimator Estimate Estimand Maximum Randomness Variable Randomness Behavioral Monte-carlo Experiment Bmc Simulation-augmented Behavior Experiment Sab Kappa Alpha Pi |
| Degenerated MgZnO films obtained by excessive zinc Journal article Journal of Crystal Growth, 2012,Volume: 347,Issue: 1,Page: 95-98 Authors: Liu J.S.; Shan C.X.; Wang S.P. ; Li B.H.; Zhang Z.Z.; Shen D.Z.
 Favorite | | TC[WOS]:11 TC[Scopus]:11 | Submit date:2019/04/08 A1. Characterization A3. Molecular Beam Epitaxy B2. Semiconducting Ii-vi Materials |
| Enhancement of ferroelectricity in the compositionally graded (Pb,Sr)TiO3 thin films derived by a sol-gel process Journal article Journal of Crystal Growth, 2006,Volume: 286,Issue: 1,Page: 37-41 Authors: Zhai J.; Yao X.; Xu Z.; Chen H.
 Favorite | | TC[WOS]:17 TC[Scopus]:17 | Submit date:2019/04/08 A1. Characterization A3. Polycrystalline deposition B1. Inorganic compounds B2. Ferroelectric materials |
| Growth and ferroelectric study of Bi3.25La0.75Ti 3O12 thin films on different substrates Journal article Journal of Crystal Growth, 2004,Volume: 267,Issue: 1-2,Page: 110-116 Authors: Zhai J.; Shen B.; Yao X.; Haydn C.
 Favorite | | TC[WOS]:13 TC[Scopus]:14 | Submit date:2019/04/08 A1. Characterization A3. Polycrystalline deposition B1. Inorganic compounds B2. Ferroelectric materials |