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| A RELIABILITY INDEX (ai) THAT ASSUMES HONEST CODERS AND VARIABLE RANDOMNESS Conference paper
Chicago, 2012-08
Authors: Zhao XS(趙心樹)
 Microsoft Word |  Favorite | | TC[WOS]:0 TC[Scopus]:0 | Submit date：2022/03/28
Reliability Intercoder Reliability Interrater Reliability Agreement Index Estimator Estimate Estimand Maximum Randomness Variable Randomness Behavioral Monte-carlo Experiment Bmc Simulation-augmented Behavior Experiment Sab Kappa Alpha Pi |
| Degenerated MgZnO films obtained by excessive zinc Journal article
Journal of Crystal Growth, 2012,Volume: 347,Issue: 1,Page: 95-98
Authors: Liu J.S.; Shan C.X.; Wang S.P.; Li B.H.; Zhang Z.Z.; Shen D.Z.
 Favorite | | TC[WOS]:11 TC[Scopus]:11 | Submit date：2019/04/08
A1. Characterization A3. Molecular Beam Epitaxy B2. Semiconducting Ii-vi Materials |
| Enhancement of ferroelectricity in the compositionally graded (Pb,Sr)TiO3 thin films derived by a sol-gel process Journal article
Journal of Crystal Growth, 2006,Volume: 286,Issue: 1,Page: 37-41
Authors: Zhai J.; Yao X.; Xu Z.; Chen H.
Favorite | | TC[WOS]:17 TC[Scopus]:17 | Submit date：2019/04/08
A1. Characterization A3. Polycrystalline deposition B1. Inorganic compounds B2. Ferroelectric materials |
| Growth and ferroelectric study of Bi3.25La0.75Ti 3O12 thin films on different substrates Journal article
Journal of Crystal Growth, 2004,Volume: 267,Issue: 1-2,Page: 110-116
Authors: Zhai J.; Shen B.; Yao X.; Haydn C.
Favorite | | TC[WOS]:13 TC[Scopus]:14 | Submit date：2019/04/08
A1. Characterization A3. Polycrystalline deposition B1. Inorganic compounds B2. Ferroelectric materials |
