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A RELIABILITY INDEX (ai) THAT ASSUMES HONEST CODERS AND VARIABLE RANDOMNESS Conference paper
Chicago, 2012-08
Authors:  Zhao XS(趙心樹)
Microsoft Word | Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2022/03/28
Reliability  Intercoder Reliability  Interrater Reliability  Agreement Index  Estimator  Estimate  Estimand  Maximum Randomness  Variable Randomness  Behavioral Monte-carlo Experiment  Bmc  Simulation-augmented Behavior Experiment  Sab  Kappa  Alpha  Pi  
Degenerated MgZnO films obtained by excessive zinc Journal article
Journal of Crystal Growth, 2012,Volume: 347,Issue: 1,Page: 95-98
Authors:  Liu J.S.;  Shan C.X.;  Wang S.P.;  Li B.H.;  Zhang Z.Z.;  Shen D.Z.
Favorite |  | TC[WOS]:11 TC[Scopus]:11 | Submit date:2019/04/08
A1. Characterization  A3. Molecular Beam Epitaxy  B2. Semiconducting Ii-vi Materials  
Enhancement of ferroelectricity in the compositionally graded (Pb,Sr)TiO3 thin films derived by a sol-gel process Journal article
Journal of Crystal Growth, 2006,Volume: 286,Issue: 1,Page: 37-41
Authors:  Zhai J.;  Yao X.;  Xu Z.;  Chen H.
Favorite |  | TC[WOS]:17 TC[Scopus]:17 | Submit date:2019/04/08
A1. Characterization  A3. Polycrystalline deposition  B1. Inorganic compounds  B2. Ferroelectric materials  
Growth and ferroelectric study of Bi3.25La0.75Ti 3O12 thin films on different substrates Journal article
Journal of Crystal Growth, 2004,Volume: 267,Issue: 1-2,Page: 110-116
Authors:  Zhai J.;  Shen B.;  Yao X.;  Haydn C.
Favorite |  | TC[WOS]:13 TC[Scopus]:14 | Submit date:2019/04/08
A1. Characterization  A3. Polycrystalline deposition  B1. Inorganic compounds  B2. Ferroelectric materials