UM

Browse/Search Results:  1-1 of 1 Help

Filters        
Selected(0)Clear Items/Page:    Sort:
Development and Active Disturbance Rejection Control of a Compliant Micro-/Nanopositioning Piezostage with Dual Mode Journal article
IEEE Transactions on Industrial Electronics, 2014,Volume: 61,Issue: 3,Page: 1475
Authors:  Tang H.;  Li Y.
Favorite |  | TC[WOS]:126 TC[Scopus]:136 | Submit date:2018/10/30
Active disturbance rejection control  atomic force microscope (AFM)  lever displacement amplifiers (LDAs)  micro-/nanopositioning system  plant uncertainties